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Optoelectronics and Advanced Materials - Reports by D. Radu and co-researchers describe recent advances in optoelectronics and advanced materials

  2008 FEB 18 - (VerticalNews.com) -- "The dependence of the viscosity on temperature for glass forming melts separates them into two categories: fragile and strong. We propose an intuitive method for quantitative evaluation of the glass forming melts fragility by a structural parameter - fragility percentage pF which allows the comparison of the glass melts without considering their particular chemical composition," investigators in Bucharest, Romania report ...read more


Optoelectronics and Advanced Materials - Research in the area of optoelectronics and advanced materials reported from M. Popescu and colleagues

  2008 FEB 18 - (VerticalNews.com) -- "The dc electrical conductivity of the bulk amorphous GeSb2Te4 material has been investigated. Pure and samples doped by 10 at. % SnSe2 have been measured," investigators in Bucharest, Romania report.

  "The conductivity in the samples has been compared with that of SnSe2 bulk sample. The activation energy of the doped sample is 0.165 eV. During heating the conductivity of doped material increases, reaches a maximum and then decreases," wrote M. Popescu and colleagues ...read more


Optoelectronics and Advanced Materials - Reports by J. Neamtu and co-researchers describe recent advances in optoelectronics and advanced materials

  2008 FEB 18 - (VerticalNews.com) -- According to a study from Craiova, Romania, "We studied the chemical growth of calcium phosphate nanostructured coatings onto silicon wafers pre-covered with carbonated polycrystalline hydroxyapatite films. Silicon wafers were covered with hydroxyapatite thin layers by radio frequency magnetron sputtering and then immersed in 370 degrees C simulated body fluids for up to 20 days."

  "Immersed structures were extracted every 2 days for studies by Fourier transform IR spectrometry. The chemically grown layers were further analyzed by X-ray diffraction and scanning electron microscopy. The growth kinetics of calcium phosphate deposits was monitored by estimating the area of phosphate, carbonate and water stretching bands of the recorded infra-red vibrational spectra. Sequential annealing in vacuum up to 950 degrees C was applied to elucidate the nature of incorporated water," wrote J. Neamtu and colleagues ...read more


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